Statistical Process Control (SPC) Training

"The best seminar I have ever sat through. Will drive a change to the way we implement SPC."

Statistical Process Control (SPC) is a set of techniques that provides an understanding of the evolution and behavior of any industrial and service oriented process or system. Unfortunately, most companies react to a process changes or problems after they have occurred. In such cases the company is being controlled by the process. The purpose of SPC is to control processes rather than be controlled by them. When applied properly, SPC provides the ability to prevent detrimental outcomes as well as identify when an improvement has occurred so that we can identify the cause.

This 3-day course is an excellent primer or follow-up to SPC-IQ® because it provides an understanding of the underlying concepts and methods of SPC. The course is a great way to learn about what really drives product quality and how to monitor processes to pro-actively drive quality improvement. Participants gain the fundamental knowledge necessary to implement SPC and learn to avoid the common mis-applications in practice. Knowledge of basic algebra is helpful but not required.

Read the "Capability Indices Can Be Deceiving" article.

Contact us to register or download this form and follow the instructions for registation.

Contact Pinnacle

Course Content

SPC Fundamentals

  • Concept of Variation
  • The Normal Distribution
  • Control Limits vs. Specification Limits
  • Definition of Control/Stability
  • Definition of Quality
  • Quality Control vs. Process Control

A Central Limit Theorem

  • Introduction to Non-Normal Data
  • The Central Limit Theorem

Conceptual Implementation of SPC

  • Measurement Systems Issues
  • Monitoring Process Behavior
  • Xbar and R Chart Concepts

Sources of Variation

  • Common and Special Cause Sources
  • Detecting Special Cause Sources

Xbar and R Charts

  • Differences Between Measurements and Averages
  • Computing Control Limits and Charting

Chart Interpretation

  • Type I and Type II Errors
  • Guidelines for Analysis of Charts
  • Out of Control Signals

Basic Statistics

  • Population versus Sample
  • Notation
  • Measures of Central Tendency (Mean, Mean)
  • Measures of Variation (Range, Standard Deviation, Variance)


  • Random, Systematic, and Rational Samples
  • Importance of Rational Sampling


  • Impact of Sample Size on Chart Sensitivity
  • Determining Sample Size

Process Capability (Read the "Capability Indices Can Be Deceiving" article.)

  • Stability vs. Capability
  • The Standard Normal
  • Z Values
  • Computing Proportion Defective
  • Capability Indices: Cp, Cpk, Pp, Ppk

Other Charts

  • Individuals & Moving Ranges
  • Xbar and S Charts
  • Attribute Charts (p, np, c, u)

Contact us to register or download this form and follow the instructions for registation.

Contact Pinnacle